Kawasaki, Japan

Hiroyuki Tokito

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Tokito. Retrieved from https://idiyas.com/inventor/hiroyuki-tokito

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Hiroyuki Tokito: Innovator in Linear Measurement Technology

Introduction

Hiroyuki Tokito is a prominent inventor based in Kawasaki, Japan. He is known for his contributions to the field of measurement technology, particularly through his innovative designs and patents. His work has significantly impacted the precision measurement industry.

Latest Patents

Hiroyuki Tokito holds a patent for a linear measuring machine. This machine features a base, a column disposed on the base, and a slider that is elevatable along the column. The elevation driving mechanism includes a motor for lifting and lowering the slider. Additionally, the machine incorporates a touch-and-back mechanism that drives the elevation mechanism to move the probe away from the measurement surface after fetching a detection value from a displacement sensor.

Career Highlights

Hiroyuki Tokito is associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His role at Mitutoyo has allowed him to develop and refine technologies that enhance measurement accuracy and efficiency.

Collaborations

Throughout his career, Hiroyuki has collaborated with notable colleagues, including Yuwu Zhang and Masaoki Yamagata. These collaborations have fostered innovation and contributed to advancements in measurement technology.

Conclusion

Hiroyuki Tokito's work in linear measurement technology exemplifies his commitment to innovation and precision. His contributions continue to influence the industry and inspire future advancements in measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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