Tokyo, Japan

Hiroyuki Jindo

This inventor holds 1 USPTO granted patent. Top assignee: Tokai Carbon. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Jindo. Retrieved from https://idiyas.com/inventor/hiroyuki-jindo-royt9a2a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hiroyuki Jindo: Inventor in Polycrystalline Silicon Carbide

Introduction

Hiroyuki Jindo is an inventor based in Tokyo, Japan, associated with Tokai Carbon. His patent work addresses the production and electrical properties of nitrogen-doped polycrystalline silicon carbide (SiC).

Latest Patents

Jindo is named on 1 patent: “Nitrogen-doped polycrystalline SiC film having an average grain size of 0.5 to 5 μm and method for producing the same by performing CVD on a heated base material.” The invention aims to produce a polycrystalline SiC molded article with small crystal grains and low volume resistivity. It describes a molded body with an average crystal grain size of 5 μm or less, a specified nitrogen concentration, and a specified product of carrier density and Hall mobility. The disclosed production method uses chemical vapor deposition (CVD) on a heated base material.

Career Highlights

Jindo’s listed patent connects his work with Tokai Carbon and focuses on improving the electrical performance of fine-grained polycrystalline SiC. The supplied information does not provide further details about his role or career history.

Collaborations

Takuji Iida and Shohei Oishi are identified as Jindo’s coworkers. The available information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Hiroyuki Jindo’s listed invention concerns nitrogen-doped polycrystalline SiC, combining fine grain size with electrical properties targeted for practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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