This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 1993.
Company Filing History:
Years Active: 1993
Title: Hiroyo Masuko: Innovator in Integrated Circuit Testing
Introduction
Hiroyo Masuko is a notable inventor based in Kawasaki, Japan. She has made significant contributions to the field of integrated circuits, particularly in the area of data transmission testing. Her innovative approach has led to the development of a unique testing system that enhances the reliability of integrated circuits.
Latest Patents
Hiroyo Masuko holds 1 patent for her invention titled "Loop test system in an integrated circuit." This patent describes a method for testing transmission and reception data within integrated circuits. In the transmission data test mode, users can set test transmission data and supply a command to a returning unit. The system allows for the comparison of test transmission data with data received by the reception unit, facilitating effective testing. Similarly, in the reception data test mode, users can set test reception data and designate reception timing, enabling thorough testing of reception data.
Career Highlights
Hiroyo Masuko is currently employed at Fujitsu Corporation, where she continues to innovate and contribute to advancements in integrated circuit technology. Her work has been instrumental in improving the efficiency and accuracy of data transmission tests.
Collaborations
Hiroyo has collaborated with several talented individuals, including Kiyohumi Mitsuze and Ryouzi Takano. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Hiroyo Masuko's contributions to integrated circuit testing exemplify her dedication to innovation in technology. Her patent and work at Fujitsu Corporation highlight her role as a leading inventor in her field.