The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 1993

Filed:

Mar. 19, 1991
Applicant:
Inventors:

Hiroyo Masuko, Kawasaki, JP;

Ryouzi Takano, Yokohama, JP;

Takashi Hatano, Machida, JP;

Kiyohumi Mitsuze, Yokohama, JP;

Ang Kar Keong, Singapore, SG;

Assignee:

Fujitsu Limited, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J / ;
U.S. Cl.
CPC ...
370 15 ; 379-5 ; 371 226 ;
Abstract

In the transmission data test mode of the integrated circuit, the user sets test transmission data as transmission data and supplies a transmission data test command to a returning unit, whereby the test transmission data output from the transmission unit is returned by the returning unit and received by the reception unit. In that case, a format converting unit receives the test transmission data in the data format of the transmission data. Then, by comparing the test transmission data and data received by the reception unit, the user can carry out a transmission data test. In the reception data test mode of the integrated circuit, the user sets test reception data, designates a reception timing and supplies a reception data test command to a test reception data input unit, whereby the test reception data is received by the reception unit via the test reception data input unit. Then, by comparing the test reception data and data received by the reception unit and corresponding to the designated reception timing, the user can perform a reception data test.


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