Ang Kar Keong

Title: Ang Kar Keong: Innovator in Integrated Circuit Testing

Introduction

Ang Kar Keong is a notable inventor based in Singapore, recognized for his contributions to the field of integrated circuits. He holds a patent that enhances the testing capabilities of integrated circuits, showcasing his innovative approach to technology.

Latest Patents

Ang Kar Keong's most recent patent is a loop test system in an integrated circuit. This invention allows users to set test transmission data and supply a transmission data test command to a returning unit. The test transmission data output from the transmission unit is returned by the returning unit and received by the reception unit. A format converting unit receives the test transmission data in the data format of the transmission data. By comparing the test transmission data and the data received by the reception unit, users can effectively carry out a transmission data test. In the reception data test mode, users can set test reception data, designate reception timing, and supply a reception data test command to a test reception data input unit. The test reception data is then received by the reception unit, allowing for a thorough reception data test.

Career Highlights

Ang Kar Keong is currently employed at Fujitsu Corporation, where he continues to innovate and contribute to advancements in technology. His work at Fujitsu has positioned him as a key player in the development of integrated circuit testing solutions.

Collaborations

Ang collaborates with talented individuals such as Ryouzi Takano and Kiyohumi Mitsuze, who contribute to the innovative environment at Fujitsu Corporation.

Conclusion

Ang Kar Keong's work in integrated circuit testing exemplifies the spirit of innovation in technology. His patent and contributions to Fujitsu Corporation highlight his role as a significant inventor in the field.