Tokyo, Japan

Hiroyasu Koike

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Hiroyasu Koike: Innovator in Open-Loop Waveform Acquisition

Introduction

Hiroyasu Koike is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of waveform acquisition technology. His innovative approach has led to the development of methods and apparatus that enhance the efficiency of electronic testing.

Latest Patents

Hiroyasu Koike holds 1 patent for his invention titled "Open-loop for waveform acquisition." This patent encompasses methods and apparatus, including computer program products, that implement techniques for open-loop waveform acquisition. The invention provides a method for acquiring an S-curve of an acquisition loop of an electron-beam probe system. The S-curve represents the response of the acquisition loop to changes in potential differences between the acquisition loop and a device under test. The method includes calibrating the acquisition loop to obtain a linear region in the acquired S-curve and using this linear portion to calculate voltage at a probe point of the device under test.

Career Highlights

Hiroyasu Koike has made significant strides in his career, particularly through his work at Nptest, Inc. His expertise in waveform acquisition has positioned him as a key figure in the development of advanced electronic testing methodologies. His innovative solutions have contributed to the efficiency and accuracy of electronic device testing.

Collaborations

Hiroyasu Koike has collaborated with notable colleagues, including Hui Wang and Kenichi Kanai. These collaborations have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Hiroyasu Koike's contributions to the field of waveform acquisition demonstrate his commitment to innovation and excellence. His work continues to influence the landscape of electronic testing technology.

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