Kyoto, Japan

Hirotsugu Kaihori


Average Co-Inventor Count = 2.1

ph-index = 4

Forward Citations = 102(Granted Patents)


Location History:

  • Hino, JP (1992)
  • Yamanashi, JP (1996)
  • Oshino, JP (1996)
  • Oshino-mura, JP (1997)
  • Kyoto, JP (1999 - 2008)

Company Filing History:


Years Active: 1992-2008

Loading Chart...
6 patents (USPTO):Explore Patents

Title: Hirotsugu Kaihori: Innovator in Optical Measurement Technologies

Introduction

Hirotsugu Kaihori is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of optical measurement technologies, holding a total of 6 patents. His work focuses on devices that enhance the precision of light measurement and semiconductor processing.

Latest Patents

Kaihori's latest patents include a reflected light intensity ratio measuring device, a device for measuring light energy absorption ratio, and a heat treatment apparatus. The measuring optical system is fixedly installed in the ceiling portion of the measuring device, while a wafer holding part supports a semiconductor wafer at the bottom. A support table is horizontally laid between the support pins of the wafer holding part, and a calibration standard member is placed on the upper surface of the support table. This innovative design allows for the measurement of light reflection intensity from the semiconductor wafer, ensuring accurate calibration at any time.

Career Highlights

Throughout his career, Hirotsugu Kaihori has worked with prominent companies such as Fanuc Corporation and Dainippon Screen Mfg. Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced measurement technologies.

Collaborations

One of his notable collaborators is Tomoyuki Terada. Their partnership has likely fostered innovative ideas and advancements in their respective fields.

Conclusion

Hirotsugu Kaihori's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in semiconductor processing and light measurement.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…