Hyogo, Japan

Hirotoshi Oikaze

USPTO Granted Patents = 8 

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Osaka, JP (2012)
  • Hyogo, JP (2013 - 2016)
  • Shiga, JP (2016 - 2018)

Company Filing History:


Years Active: 2012-2025

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8 patents (USPTO):Explore Patents

Title: Hirotoshi Oikaze: Innovator in Inner Layer Measurement Technologies

Introduction

Hirotoshi Oikaze is an accomplished inventor based in Hyogo, Japan. With a total of six patents to his name, Oikaze is recognized for his significant contributions to measuring technologies and protective devices in optical equipment.

Latest Patents

Among his recent innovations, Oikaze's patents include an "Inner Layer Measurement Method" and an "Inner Layer Measurement Device." The inner layer measurement method involves the generation of first and second irradiation lights, utilizing unique configurations of short pass and long pass filters to measure different XY sectional surfaces of a semi-transparent body. Additionally, he developed a protective member designed to safeguard an objective lens, featuring an innovative insertion opening and liquid seal mechanism that simplifies operational processes.

Career Highlights

Oikaze has had a remarkable career, having worked with notable companies including Panasonic Intellectual Property Management Co., Ltd. and Panasonic Corporation. His expertise in optical technologies has allowed him to make substantial contributions to the field.

Collaborations

During his career, Hirotoshi has collaborated with esteemed colleagues such as Yasuhiro Kabetani and Yohei Takechi. Their joint efforts have furthered the advancement of measurement technologies and protective equipment.

Conclusion

Hirotoshi Oikaze stands out as a prominent figure in innovation, particularly in the realm of measurement methods and protective devices. His inventive spirit and dedication to enhancing optical technologies continue to leave a lasting impact within the industry.

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