Panasonic Intellectual Property Management Co., Ltd.

Panasonic Corporation

Hirotoshi Oikaze

Yasuhiro Kabetani

Hiroyuki Inoue

Yohei Takechi

Takashi Urashima

Masato Kinoshita

Tomotaka Furuta

Yuki Chikazawa

Atsushi Fukui

Katsuyuki Nagahama

Kentaro Nishiwaki

Yumi Hanato

A hair care device according to the present disclosure includes a tank that stores a liquid, a pump that outputs the liquid stored in the tank, and a controller that controls an output of the pump. The hair care device according to the present disclosure further includes a detector that detects swing of the hair care device. The controller adjusts the output of the pump based on a detection value of the detector. Thus, the hair care device that suitably sprays a cosmetic component is provided.

Hair care device

A hair care device according to the present disclosure includes a tank that stores a liquid, a liquid feed pump that outputs the liquid stored in the tank, and a controller that controls an output of the liquid feed pump. The hair care device according to the present disclosure further includes a detector that detects torque of the liquid feed pump. The controller adjusts the output of the liquid feed pump based on a detection value of the detector. Thus, the hair care device that suitably sprays a cosmetic component is provided.

Haircare device

In an inner layer measurement method, first irradiation light and second irradiation light having a peak wavelength longer than that of the first irradiation light are formed by changing at least one of a position where light emitted from a lamp is transmitted through a short pass filter and a position where light emitted from a lamp is transmitted through a long pass filter. Then, a first XY sectional surface of a semitransparent body is measured by irradiating the first XY sectional surface with the first irradiation light. A second XY sectional surface positioned on a layer deeper than the first XY sectional surface is measured by irradiating the second XY sectional surface with the second irradiation light. Each of the short pass filter and the long pass filter can transmit the light and has properties of changing a cutoff wavelength according to the position where the light is transmitted.

Inner layer measurement method and inner layer measurement device

A protective member protects an objective lens. The protective member includes an insertion opening through which an objective lens is configured to be inserted and a main body configured to cover the inserted objective lens. The main body includes a side wall portion connected to the insertion opening and a bottom portion connected to the side wall portion as well as facing the insertion opening, and covers the inserted objective lens with the side wall portion and the bottom portion. The protective member further includes a liquid disposed inside the main body, a sealing film body for sealing the insertion opening and a window arranged in the bottom portion of the main body, through which light transmits. The protective member can simplify the work.

Protective member and method for using protective member

A method of manufacturing a light-emitting device which includes a light-emitting source is provided by applying, onto the light-emitting source, a fluorescent resin which includes fluorescent particles and is stored in and discharged from an applicator. The method includes measuring a first concentration which is a concentration of the fluorescent particles included in the fluorescent resin discharged from the applicator; and applying, onto the light-emitting source, the fluorescent resin in an application amount determined based on the first concentration which has been measured and reference data which indicates a relationship between a concentration of the fluorescent particles and an application amount of the fluorescent resin that enables the light-emitting device to have constant chromaticity.

Method and apparatus for manufacturing a light-emitting device including correction of an application amount of a fluorescent resin based on a fluorescent particle concentration

A surface profile measuring apparatus includes a reflection unit to reflect a reference beam diffracted by a first diffraction grating and cause the reflected reference beam to be incident on the first diffraction grating again, a detection unit to receive an interference beam in which the reference beam diffracted again by the first diffraction grating and a measuring beam reflected by a sample surface optically interfere with each other, and detect an interference intensity signal for each, wavelength in the interference beans, a shifting unit to shift the first diffraction grating in a direction perpendicular to a grating groove direction of the first diffraction grating, a calculation unit to calculates a phase on a basis of the interference intensity signal for each wavelength varying with a degree of shift, and a measurement unit to measure the sample surface.

Surface profile measuring apparatus and method

With a film thickness measuring apparatus of the present invention, a substrate having a transparent film formed on its front surface is placed on a placement unit. A half mirror divides light from a light source such that divided light beams are emitted to the front surface of the substrate and to a reference plane, and overlays reflected light from the front surface of the substrate and reflected light from the reference plane on each other to form interfering light. The interfering light is imaged by an imager. Based on the imaging result, the film thickness of the transparent film is calculated by an arithmetic unit. An optical filter with which an intensity spectrum of transmitted light exhibits a plurality of peaks, the optical filter is disposed between the light source and the half mirror.

Film thickness measuring apparatus using interference and film thickness measuring method using interference

The measurement accuracy of an apparatus for measuring the surface shape of an object utilizing a two-wavelength phase-shift interferometry is improved. A low-coherence light source, a plurality of wavelength filters with different transmission wavelengths, an angle control unit and an analysis unit are provided. When performing a two-wavelength phase shift method, the analysis unit detects the wavelength difference between two wavelengths, and corrects a calculated wavelength value and a calculated phase value of one of the wavelengths for preventing a fringe-order calculation error. Next, the angle of the wavelength filters is controlled for making the actual wavelength difference coincident with a designed value. Thus, the wavelength difference between the two wavelengths is continuously controlled to be constant, which enables measurements of surface shapes with high accuracy, even when there are wavelength fluctuations due to the temperature change or the time elapse.

Growing community of inventors

Hyogo, Japan

Hirotoshi Oikaze