Yokkaichi, Japan

Hiroshi Tsukada

This inventor holds 1 USPTO granted patent. Top assignee: Kioxia Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Tsukada. Retrieved from https://idiyas.com/inventor/hiroshi-tsukada-30xa6mls

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Hiroshi Tsukada: Innovator in Modeling Methods

Introduction

Hiroshi Tsukada is a notable inventor based in Yokkaichi, Japan. He has made significant contributions to the field of modeling methods, particularly in the context of shape measurement targets. His innovative approach has garnered attention in the industry.

Latest Patents

Hiroshi Tsukada holds 1 patent for a modeling method. This method involves approximating a shape measurement target provided in a structure with a stack structure by a boundary line. A standard deviation is included as a tolerance for the measurement value of the shape measurement target. The calculation boundary line is arranged to converge within this tolerance, effectively expressing the shape of the measurement target.

Career Highlights

Tsukada is currently employed at Kioxia Corporation, where he continues to develop and refine his innovative ideas. His work has been instrumental in advancing the technology related to shape measurement and modeling methods.

Collaborations

Throughout his career, Hiroshi Tsukada has collaborated with talented individuals such as Shimpei Miura and Kiminori Yoshino. These collaborations have contributed to the success of his projects and the advancement of their shared goals.

Conclusion

Hiroshi Tsukada's contributions to modeling methods highlight his innovative spirit and dedication to advancing technology. His work at Kioxia Corporation and his patent in shape measurement methods reflect his significant impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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