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For the Inventor, By the Inventor

Nirasaki, Japan

Hiroshi Shimoyama

This inventor holds 6 USPTO granted patents. Top assignee: Tokyo Electron Limited. Active years: 2011-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Shimoyama. Retrieved from https://idiyas.com/inventor/hiroshi-shimoyama-jrxr8zvb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 6

% Patents Active = 66.7

Average Co-Inventor Count = 3.5

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:

goldMedal6 out of 10,933 
 
Tokyo Electron Limited
 patents

Years Active: 2011-2016

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6 patents (USPTO):Explore Patents
1. 9519022 - Method for pre-heating probe card (2016-12-13),
2. 9201115 - Wafer inspection apparatus (2015-12-01),
3. 8674712 - Apparatus for driving placing table (2014-03-18),
4. 8113084 - Mounting device (2012-02-14),
5. 7963513 - Mounting device (2011-06-21),
6. 7940065 - Probe apparatus and method for measuring electrical characteristics of chips (2011-05-10),

Title: Hiroshi Shimoyama: Innovator in Wafer Inspection Technology

Introduction

Hiroshi Shimoyama is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of wafer inspection technology, holding a total of 6 patents. His work has been instrumental in advancing the efficiency and accuracy of wafer inspection processes.

Latest Patents

Hiroshi's latest patents include a "Method for pre-heating probe card" and a "Wafer inspection apparatus." The wafer inspection apparatus features a first and second wafer transfer mechanism, an alignment chamber, and multiple inspection chambers. The first wafer transfer mechanism is designed to transfer wafers individually from a housing. The alignment chamber is equipped with a mechanism to align the wafer at an inspection position for electrical characteristics inspection. The second wafer transfer mechanism facilitates the transfer of the wafer through a retaining support in a designated transfer area. The inspection chambers are strategically arranged to inspect the electrical characteristics of the wafers transferred by the second mechanism.

Career Highlights

Hiroshi Shimoyama is currently employed at Tokyo Electron Limited, a leading company in the semiconductor industry. His innovative work has contributed to the development of advanced technologies that enhance wafer inspection processes.

Collaborations

Hiroshi has collaborated with notable coworkers, including Kazuya Yano and Masaru Suzuki. Their combined expertise has fostered a collaborative environment that drives innovation in their projects.

Conclusion

Hiroshi Shimoyama's contributions to wafer inspection technology exemplify his dedication to innovation and excellence. His patents and collaborative efforts continue to shape the future of the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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