Nirasaki, Japan

Hiroshi Shimoyama


Average Co-Inventor Count = 3.5

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2011-2016

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6 patents (USPTO):Explore Patents

Title: Hiroshi Shimoyama: Innovator in Wafer Inspection Technology

Introduction

Hiroshi Shimoyama is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of wafer inspection technology, holding a total of 6 patents. His work has been instrumental in advancing the efficiency and accuracy of wafer inspection processes.

Latest Patents

Hiroshi's latest patents include a "Method for pre-heating probe card" and a "Wafer inspection apparatus." The wafer inspection apparatus features a first and second wafer transfer mechanism, an alignment chamber, and multiple inspection chambers. The first wafer transfer mechanism is designed to transfer wafers individually from a housing. The alignment chamber is equipped with a mechanism to align the wafer at an inspection position for electrical characteristics inspection. The second wafer transfer mechanism facilitates the transfer of the wafer through a retaining support in a designated transfer area. The inspection chambers are strategically arranged to inspect the electrical characteristics of the wafers transferred by the second mechanism.

Career Highlights

Hiroshi Shimoyama is currently employed at Tokyo Electron Limited, a leading company in the semiconductor industry. His innovative work has contributed to the development of advanced technologies that enhance wafer inspection processes.

Collaborations

Hiroshi has collaborated with notable coworkers, including Kazuya Yano and Masaru Suzuki. Their combined expertise has fostered a collaborative environment that drives innovation in their projects.

Conclusion

Hiroshi Shimoyama's contributions to wafer inspection technology exemplify his dedication to innovation and excellence. His patents and collaborative efforts continue to shape the future of the semiconductor industry.

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