Chiryu, Japan

Hiroshi Ohara

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Jtekt Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Ohara. Retrieved from https://idiyas.com/inventor/hiroshi-ohara-i7lzxgn6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Hiroshi Ohara: Innovator in Optical Non-Destructive Inspection

Introduction

Hiroshi Ohara is a prominent inventor based in Chiryu, Japan. He has made significant contributions to the field of optical non-destructive inspection. His innovative methods and apparatus have advanced the capabilities of inspection technologies.

Latest Patents

Hiroshi Ohara holds a patent for an "Optical Non-Destructive Inspection Method and Optical Non-Destructive Inspection Apparatus." This patent outlines a comprehensive process that includes a heating laser emission step, an information acquisition step for measurement point information, a joint state determination step, and a preliminary heating step. The method is designed to cause thermal distortion in a first member without causing any damage, showcasing his expertise in optical technologies.

Career Highlights

Hiroshi Ohara is associated with Jtekt Corporation, where he has been instrumental in developing advanced inspection technologies. His work has not only contributed to the company's success but has also set new standards in the industry.

Collaborations

Hiroshi has collaborated with notable colleagues, including Naoki Matsumoto and Daisuke Kuroda. Their combined efforts have led to innovative solutions in the field of optical inspection.

Conclusion

Hiroshi Ohara's contributions to optical non-destructive inspection highlight his role as a key innovator in this specialized field. His patent and collaborative efforts continue to influence advancements in inspection technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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