The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jul. 11, 2018
Jtekt Corporation, Osaka-shi, Osaka, JP;
Naoki Matsumoto, Okazaki, JP;
Ryota Umezawa, Nishio, JP;
Daisuke Kuroda, Okazaki, JP;
Hiroshi Ohara, Chiryu, JP;
JTEKT CORPORATION, Osaka-shi, JP;
Abstract
An optical non-destructive inspection method includes: a heating laser emission step; an information acquisition step of acquiring measurement point information and heating laser information; a joint state determination step of determining the joint state on the basis of the measurement point information and the heating laser information; and a preliminary heating step, which is performed before the heating laser emission step, of causing thermal distortion in a first member by irradiating a measurement point, or a preliminary heating range that includes the measurement point, or a preliminary heating point set in the preliminary heating range, with preliminary heating laser adjusted to a thermal distortion generation intensity, which is a constant output intensity, and an irradiation time such that the thermal distortion is caused without destroying the first member.