Okazaki, Japan

Daisuke Kuroda

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Jtekt Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daisuke Kuroda. Retrieved from https://idiyas.com/inventor/daisuke-kuroda-xok3tvlg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Daisuke Kuroda: Innovator in Optical Non-Destructive Inspection

Introduction

Daisuke Kuroda is a prominent inventor based in Okazaki, Japan. He has made significant contributions to the field of optical non-destructive inspection. His innovative methods and apparatus have the potential to enhance quality control processes in various industries.

Latest Patents

Kuroda holds a patent for an "Optical Non-Destructive Inspection Method and Optical Non-Destructive Inspection Apparatus." This patent outlines a comprehensive method that includes several steps: a heating laser emission step, an information acquisition step for measurement point and heating laser information, a joint state determination step based on the acquired information, and a preliminary heating step to induce thermal distortion without damaging the first member.

Career Highlights

Daisuke Kuroda is associated with Jtekt Corporation, where he applies his expertise in optical inspection technologies. His work focuses on developing advanced methods that improve the reliability and efficiency of inspection processes.

Collaborations

Kuroda collaborates with talented colleagues such as Ryota Umezawa and Naoki Matsumoto. Together, they contribute to innovative projects that push the boundaries of technology in their field.

Conclusion

Daisuke Kuroda's contributions to optical non-destructive inspection highlight his role as a key innovator in the industry. His patent and collaborative efforts reflect a commitment to advancing technology and improving inspection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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