Hiroshi Makihara

Title: Hiroshi Makihara: Innovator in Automatic Focus Detection

Introduction

Hiroshi Makihara is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of optical technology, particularly in automatic focus detection methods and apparatuses. With a total of 2 patents to his name, Makihara continues to push the boundaries of innovation in his field.

Latest Patents

Makihara's latest patents include an automatic focus detection method and an automatic focus detection apparatus. The automatic focus detection method involves irradiating a single spot of a sample with multiple beams of illuminating light, which are transmitted and condensed through an objective lens. This method allows for the detection of defocus based on discrepancies between the optical axis and the center of the light intensity distribution. His second patent, the plate thickness measuring method and apparatus, utilizes a fine pattern projected on both surfaces of an object to measure its thickness. By detecting the contrast of the projected pattern image, the apparatus can estimate the thickness based on the positions of the object lenses.

Career Highlights

Hiroshi Makihara is currently employed at Hitachi, Ltd., where he applies his expertise in optical technologies. His work has been instrumental in developing advanced methods for focus detection and measurement, contributing to the company's reputation for innovation in technology.

Collaborations

Makihara has collaborated with notable colleagues such as Yukihiro Shibata and Shunji Maeda. These collaborations have further enhanced his research and development efforts in optical technology.

Conclusion

Hiroshi Makihara is a distinguished inventor whose work in automatic focus detection has made a significant impact in the field of optical technology. His innovative patents and contributions continue to shape advancements in this area.