Nishihara, Japan

Hiroshi Kageyama

This inventor holds 1 USPTO granted patent. Top assignees: Samsung Electronics Co., Ltd., University of the Ryukyus. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Kageyama. Retrieved from https://idiyas.com/inventor/hiroshi-kageyama-7h83pg2c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hiroshi Kageyama: Innovator in Imaging Technology

Introduction

Hiroshi Kageyama is a notable inventor based in Nishihara, Japan. He has made significant contributions to the field of imaging technology, particularly through his innovative patent related to imaging sensors.

Latest Patents

Kageyama holds a patent for an imaging sensor and display device that includes a photoelectric conversion element. This imaging sensor features a plurality of transistors connected to the photoelectric conversion element, which are designed to transmit charges generated by the element. Notably, the transistors include at least one silicon semiconductor layer and at least one oxide semiconductor layer, showcasing a blend of materials for enhanced performance.

Career Highlights

Throughout his career, Kageyama has worked with prominent organizations, including Samsung Electronics Co., Ltd. and the University of the Ryukyus. His experience in these institutions has allowed him to develop and refine his innovative ideas in imaging technology.

Collaborations

Kageyama has collaborated with notable individuals in his field, including Kyung Bae Park and Akira Higa. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Hiroshi Kageyama's work in imaging technology exemplifies the impact of innovation in modern electronics. His contributions continue to influence the development of advanced imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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