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For the Inventor, By the Inventor

Kawasaki, Japan

Hiroshi Daiku

This inventor holds 12 USPTO granted patents and 1 published patent application. Top assignees: Fujitsu Corporation, Fujitsu Microelectronics Limited, Fujitsu Semiconductor Limited. Active years: 1996-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Daiku. Retrieved from https://idiyas.com/inventor/hiroshi-daiku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 12 

% Patents Active = 33.3

Average Co-Inventor Count = 2.9

ph-index = 4

Forward Citations = 72(Granted Patents)


Company Filing History:

goldMedal5 out of 39,378 
 
Fujitsu Corporation
 patents
silverMedal4 out of 467 
 
Fujitsu Microelectronics Limited
 patents
bronzeMedal3 out of 1,674 
 
Fujitsu Semiconductor Limited
 patents

Years Active: 1996-2012

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12 patents (USPTO):Explore Patents
1. 8223247 - Method for calculating shift amount of image pickup element and image pickup element (2012-07-17),
2. 8030692 - Solid state image sensing device (2011-10-04),
3. 7920181 - Semiconductor integrated apparatus and black level correction method for image sensor (2011-04-05),
4. 7715617 - Circuit and method for correction of defect pixel (2010-05-11),
5. 7626616 - Automatic gain control circuit with exposure control circuit (2009-12-01),
6. 7612810 - Reduction of effect of image processing on image sensor (2009-11-03),
7. 7489347 - Method and circuit for detecting flicker noise (2009-02-10),
8. 7352397 - Circuit and method for contour enhancement (2008-04-01),
9. 7263215 - Circuit and method for correction of defect pixel (2007-08-28),
10. 7106368 - Method of reducing flicker noises of X-Y address type solid-state image pickup device (2006-09-12),
11. 5891512 - Infrared detection device comprising a pyroelctric thin film and method (1999-04-06),
12. 5589687 - Infrared detection device comprising a pyroelectric thin film and method (1996-12-31),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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