Hiroo Ito

Title: Hiroo Ito: Innovator in Semiconductor Technology

Introduction

Hiroo Ito, a prominent inventor based in Tokyo, Japan, is known for his significant contributions to semiconductor technology. With two patents to his name, his work showcases innovative methods for testing semiconductor devices, essential for advancing electronic circuitry and performance.

Latest Patents

Hiroo Ito's latest patents include a remarkable **semiconductor device tester and method of testing semiconductor devices**. This invention involves a tester substrate structurally mirroring a product substrate, minus the semiconductor device. It features an electrically conductive sheet that covers the area designated for the semiconductor device, which remains electrically insulating in a certain direction. Hiroo's design also incorporates a holder to support and connect the semiconductor device with the tester substrate, enhancing the efficiency of testing processes.

Another significant patent is related to a **large-scale integrated circuit and method for testing a board of the same**. This circuit innovatively divides its scan path into an I/O scan path and an internal scan path. By implementing a selector that can choose between these paths based on a test mode signal, Hiroo's invention optimizes the testing procedure, making it more versatile and effective.

Career Highlights

Hiroo Ito is currently associated with NEC Corporation, a leading player in the global technology arena. His tenure in this reputable corporation has allowed him to explore and pioneer advancements in semiconductor devices, making substantial contributions to the field.

Collaborations

Throughout his career, Hiroo has worked alongside notable colleagues such as Hajime Matsuzawa and Michinobu Tanioka. Their collaborative efforts contribute to innovative solutions in semiconductor technology, fostering a productive working environment that encourages the development of cutting-edge inventions.

Conclusion

Hiroo Ito stands out as an influential figure in the realm of semiconductor innovation. His patents demonstrate a profound understanding of testing methodologies, which are critical for the performance of modern electronic devices. As the technology landscape continues to evolve, Hiroo's contributions will likely remain pivotal in shaping the future of semiconductor testing and integration.