The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2002
Filed:
Nov. 04, 1998
Applicant:
Inventors:
Hajime Matsuzawa, Tokyo, JP;
Hiroo Ito, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
In a large-scale integrated circuit, a scan path is divided between an I/O scan path that is formed by a series connection between only flip-flops that are in a region near an I/O pin and an internal scan path that is formed by a series connection between other flip-flops. A selector has one of its inputs connected to another end of the I/O scan path and to one end of the internal scan path, another of its inputs connected to another end of the internal scan path, and its output connected to a scan out. This selector, based on a test mode signal, selects either all scan paths or only the I/O scan path.