This inventor holds 1 USPTO granted patent. Top assignee: Tohoku Techno Arch Co., Ltd.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Hironori Tomyo: Innovator in Non-Destructive Inspection Techniques
Introduction
Hironori Tomyo is a notable inventor based in Sendai, Japan. He has made significant contributions to the field of non-destructive inspection methods, particularly through his innovative patent. His work focuses on enhancing the evaluation of material characteristics and flaws in conductive materials.
Latest Patents
Hironori Tomyo holds a patent for a method of non-destructive inspection of rear surface flaws and material characteristics using electromagnetic techniques. This method involves supplying currents to a conductive inspection subject and evaluating both rear surface and embedded flaws. By utilizing a DC electric potential method, the inspection sensitivity is increased by locally heating the front surface of the inspection subject. This process alters the electric resistivity distribution, resulting in improved current supply on the rear surface compared to cases without heating.
Career Highlights
Hironori Tomyo is associated with Tohoku Techno Arch Co., Ltd., where he applies his expertise in non-destructive testing. His innovative approach has led to advancements in the inspection techniques used in various industries. His patent represents a significant step forward in ensuring the integrity and safety of materials.
Collaborations
Hironori has collaborated with notable colleagues, including Masumi Saka and Yasuko Saito. Their combined efforts contribute to the ongoing development of advanced inspection technologies.
Conclusion
Hironori Tomyo's contributions to non-destructive inspection methods highlight his role as an influential inventor in the field. His innovative techniques continue to pave the way for advancements in material evaluation and safety.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile