The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Oct. 06, 2004
Masumi Saka, Sendai, JP;
Hironori Tomyo, Sendai, JP;
Yasuko Saito, Sendai, JP;
Tohoku Techno Arch Co., Ltd., , JP;
Abstract
The non-destructive inspection method, wherein the non-destructive inspection method supplies currents to a conductive inspection subject and evaluates the rear surface flaw and the embedded flaw of these the inspection subject, or the material characteristic using a DC electric potential method, and an inspection sensitivity to the rear surface flaw, the embedded flaw, or the material characteristic is increased by changing the electric resistivity distribution inside the inspection subject by locally heating a front surface of the inspection subject, thereby increasing an electric resistivity of the front surface of the inspection subject compared with an electric resistivity of the rear surface thereof, resulting in increasing currents supplied on a rear surface side compared with a case without the front surface being heated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile