Hiroki Takebuchi

Title: Hiroki Takebuchi: Innovator in Semiconductor Technology

Introduction

Hiroki Takebuchi is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of surface temperatures of semiconductor wafers. His innovative approach has implications for the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

Hiroki Takebuchi holds a patent for a "Method for measuring surface temperature of semiconductor wafer." This method involves emitting a reference light that includes infrared rays toward a wafer substrate. The technology selectively detects infrared rays of various wavelengths, which are shorter than 1 µm, from the emitted reference light, the reflected light from the wafer substrate, and the light radiated from the substrate itself. Based on this detection, the surface temperature of the wafer substrate is calculated, allowing for precise control of a substrate-heating element.

Career Highlights

Throughout his career, Hiroki Takebuchi has worked with prominent companies in the semiconductor industry. He has been associated with Minolta Camera and Tokyo Electron Limited, where he has contributed to advancements in semiconductor manufacturing technologies. His work has been instrumental in enhancing the performance and reliability of semiconductor devices.

Collaborations

Hiroki Takebuchi has collaborated with esteemed colleagues, including Jiro Arima and Hiroji Tsujimura. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in the semiconductor field.

Conclusion

Hiroki Takebuchi's contributions to semiconductor technology, particularly through his patented methods, highlight his role as a key innovator in the industry. His work continues to influence the efficiency of semiconductor manufacturing processes, showcasing the importance of innovation in technology.