This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ricoh Company, Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Hiroki Tachibana: Patent Inventor in Inspection Technology
Introduction
Hiroki Tachibana is an inventor associated with Ricoh Company, Ltd. and located in Kanagawa, Japan. His listed patent work concerns image inspection methods and apparatuses for identifying defects in printed matter.
Latest Patents
Tachibana is credited with 1 patent: “Inspection Method and Apparatus for Reading Image to Generate Inspection Image and Detecting Defect in the Image, and Non-Transitory Recording Medium.”
The invention describes an inspection apparatus, method, and program that generate inspection images from reader results and detect defects in those images. It also compares an image of printed matter with a master image generated from print data to determine whether the printed matter has a defect. When a defect is detected in a reference-face inspection image, the system excludes that defect’s position from the area inspected for defects in the printed matter.
Career Highlights
Tachibana’s listed patent is associated with Ricoh Company, Ltd., a company whose work includes imaging and printing technologies. The patent focuses on distinguishing defects in the printed output from defects detected during inspection of a reference face.
Collaborations
The available information associates Tachibana’s patent with Ricoh Company, Ltd. It does not specify additional collaborators or co-inventors.
Conclusion
Hiroki Tachibana’s patent contribution addresses a practical challenge in print inspection by helping separate reference-image defects from defects in printed matter.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile