The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Apr. 09, 2024
Hiroki Tachibana, Kanagawa, JP;
Hiroki Tachibana, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An inspection apparatus, an inspection method, and a program stored on a recording medium, each of which generates a second inspection target image, based on a result of a reader reading a reference face; detects a defect in the second inspection target image; generates a first inspection target image, based on an image read at the reader from a printed matter printed at a printing apparatus; determines a defect in the printed matter, based on the first inspection target image and a master image generated from print data of the printed matter; and in a case where the defect is detected in the second inspection target image, excludes a position of the detected defect from an area where a defect in the printed matter is inspected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile