Tokyo, Japan

Hiroki Nakano

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Hitachi High-Tech Corporation. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Nakano. Retrieved from https://idiyas.com/inventor/hiroki-nakano-mzzxllhv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Innovations of Hiroki Nakano in Automatic Analysis

Introduction

Hiroki Nakano is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of automatic analysis, particularly with his innovative patent that enhances the accuracy of liquid volume detection in reagent containers.

Latest Patents

Hiroki Nakano holds a patent for an automatic analyzer designed to accurately detect the liquid volume of a reagent, regardless of the shape of the reagent container. This invention includes a reagent container that holds the reagent, an emission unit that emits light into the container, a light receiving unit that captures the emitted light, and a determination unit that assesses the liquid level based on the received light. The analyzer determines whether the liquid volume in the container is equal to or less than a predetermined value, ensuring precise measurements.

Career Highlights

Hiroki Nakano is associated with Hitachi High-Tech Corporation, where he has been instrumental in advancing technologies related to automatic analysis. His work has contributed to the development of more efficient and reliable analytical instruments.

Collaborations

Hiroki Nakano has collaborated with notable colleagues, including Hidetsugu Tanoue and Yoichiro Suzuki, to further enhance the capabilities of their inventions and research.

Conclusion

Hiroki Nakano's innovative work in automatic analysis exemplifies the importance of precision in scientific measurements. His contributions continue to impact the field positively, showcasing the potential of technology in improving analytical processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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