The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Feb. 12, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Koji Hatakeyama, Tokyo, JP;

Satoru Yamamoto, Tokyo, JP;

Hidetsugu Tanoue, Tokyo, JP;

Hiroki Nakano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1072 (2013.01); G01N 35/00663 (2013.01); G01N 35/025 (2013.01); G01N 2035/00356 (2013.01); G01N 2035/1076 (2013.01);
Abstract

An automatic analyzer capable of confirming the amount of sample aspirated by a sample dispensing unit is provided. The automatic analyzer includes an incubator which holds a reaction container in which a liquid mixture of the sample and a reagent is accommodated, a sample dispensing unit which dispenses the sample by aspirating the sample from a sample container in which the sample is accommodated and storing the aspirated sample in a storage portion and then discharging the sample to the reaction container, and a measurement portion which measures the amount of sample in the storage portion on the basis of a detected signal obtained by detecting light passing through the storage portion while irradiating the storage portion with light.


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