Tokyo, Japan

Hiroki Hashiguchi

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Jeol Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Hashiguchi. Retrieved from https://idiyas.com/inventor/hiroki-hashiguchi-5hj6ob0l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hiroki Hashiguchi: Innovator in Charged Particle Beam Technology

Introduction

Hiroki Hashiguchi is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of charged particle beam technology. His innovative work has led to the development of a unique device that enhances imaging capabilities in various applications.

Latest Patents

Hiroki Hashiguchi holds a patent for a "Charged particle beam device and image generation method." This invention involves a charged particle beam device that scans a specimen with a charged particle beam and generates an image based on a detected signal from a detector. The device includes a blanker for beam blanking, an image acquisition unit that captures multiple images during the scan, and an integrated image generation unit that creates an integrated image from the acquired data. He has 1 patent to his name.

Career Highlights

Hiroki Hashiguchi is associated with Jeol Ltd., a company renowned for its advanced scientific instruments and technology. His work at Jeol Ltd. has significantly contributed to the advancement of imaging techniques in various scientific fields.

Collaborations

Hiroki has collaborated with notable colleagues, including Kazuki Yagi and Ruth Shewmon Bloom. Their combined expertise has fostered innovation and development in their respective areas of research.

Conclusion

Hiroki Hashiguchi's contributions to charged particle beam technology exemplify the spirit of innovation in modern science. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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