This inventor holds 12 USPTO granted patents and 5 published patent applications. Top assignees: Seiko Epson Corporation, Sieko Epson Corporation. Active years: 2009-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009-2026
Title: Hirokazu Yamaga: Innovator in Optical Scanning Technology
Introduction
Hirokazu Yamaga is a prominent inventor based in Chino, Japan. He has made significant contributions to the field of optical scanning technology, holding a total of 12 patents. His work has advanced the capabilities of various measurement and robotic systems.
Latest Patents
Yamaga's latest patents include an optical scanning apparatus, a three-dimensional measurement apparatus, and a robot system. The optical scanning apparatus features a MEMS substrate and an environment detection sensor that detects environmental factors associated with the mirror. This sensor is strategically positioned to optimize functionality without overlapping with the MEMS substrate. Additionally, his optical scanning device incorporates a light source unit and a scanning unit with a mirror that reflects light while swinging around a swing axis. This innovative design is housed in an enclosed space that allows for efficient light transmission.
Career Highlights
Throughout his career, Hirokazu Yamaga has worked with notable companies, including Seiko Epson Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies in optical scanning and measurement.
Collaborations
Yamaga has collaborated with esteemed colleagues such as Yasushi Mizoguchi and Norio Nakamura. Their combined expertise has fostered innovation and development in their respective fields.
Conclusion
Hirokazu Yamaga's contributions to optical scanning technology and his impressive portfolio of patents highlight his role as a leading inventor in this domain. His work continues to influence advancements in measurement and robotic systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
