Yokohama, Japan

Hirokazu Koyabu

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2010-2015.

USPTO Granted Patents = 2 

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 2010-2015

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2 patents (USPTO):Explore Patents

Title: Hirokazu Koyabu: Innovator in Inspection Technology

Introduction

Hirokazu Koyabu is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of inspection technology, particularly in methods and devices for analyzing defects in various materials. With a total of 2 patents to his name, Koyabu's work is recognized for its innovative approach to defect detection and analysis.

Latest Patents

Koyabu's latest patents focus on an inspection method and device capable of conducting composition analysis of defects detected by elastic or Stokes scattered light. These inventions allow for the optical detection of defects on the surface of inspection objects, as well as their internal composition. The methods enable the detection of defects, classification, and analysis based on their features and positions, enhancing the efficiency and accuracy of inspections.

Career Highlights

Hirokazu Koyabu is associated with Hitachi High-Technologies Corporation, where he has been instrumental in developing advanced inspection technologies. His expertise in the field has led to innovative solutions that improve the quality control processes in various industries.

Collaborations

Koyabu has collaborated with notable colleagues such as Takahiro Jingu and Yuta Urano. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in inspection technology.

Conclusion

Hirokazu Koyabu's contributions to inspection technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the way defects are detected and analyzed, paving the way for advancements in quality control.

Profile summary based on public USPTO records.
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