Hitachinaka, Japan

Hirokazu Ito

This inventor holds 4 USPTO granted patents. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2008-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirokazu Ito. Retrieved from https://idiyas.com/inventor/hirokazu-ito-syxv7r8e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 2.2

ph-index = 3

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 2008-2013

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4 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Hirokazu Ito

Introduction

Hirokazu Ito, a prominent inventor hailing from Hitachinaka, Japan, has made significant strides in the field of circuit pattern inspection. With a total of four patents to his name, his innovative approaches continue to enhance the efficiency and precision of electronic manufacturing.

Latest Patents

Among his latest patents are groundbreaking developments including a circuit pattern inspecting apparatus, a management system incorporating this apparatus, and a method for inspecting circuit patterns. Ito's apparatus is designed to prevent the deterioration of operation rates by measuring image noise and identifying potential abnormal states. This apparatus enables the detection of circuit pattern abnormalities through the irradiation of a substrate with an electron beam, effectively capturing and analyzing secondary or reflected electrons generated during the process.

Career Highlights

Hirokazu Ito's career is marked by his remarkable contributions to the development of pattern inspection technologies. His innovations have led to advancements such as a defect confirmation screen within pattern inspection apparatuses, which facilitates user-friendly creation of recipes for defect detection. Key features of his invention include a map display for wafer maps, an image display for defect images, a list display for detailed defect information, and a graph display for analyzing selected defects. This integrated approach enhances the communication between different display parts, ensuring that users can efficiently manage defect inspection processes.

Collaborations

Throughout his career, Ito has worked alongside esteemed colleagues such as Masayoshi Takeda and Hiroyuki Takahashi. Together, they have propelled advancements in their field, fostering an environment of collaborative innovation at Hitachi High-Technologies Corporation.

Conclusion

Hirokazu Ito stands out as a key figure in the innovation landscape of circuit pattern inspection technologies. His work at Hitachi High-Technologies Corporation not only exemplifies his commitment to advancing electronic manufacturing but also highlights the importance of collaboration and the continuous pursuit of excellence in the field of invention.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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