Tokyo, Japan

Hirohiko Okabe

This inventor holds 1 USPTO granted patent. Top assignee: Sekonic Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirohiko Okabe. Retrieved from https://idiyas.com/inventor/hirohiko-okabe-816b5g6u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Hirohiko Okabe: Innovator in Photometric Technology

Introduction

Hirohiko Okabe is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of photometric technology, particularly through his innovative designs and patents. His work focuses on enhancing measurement precision in photometric apparatuses.

Latest Patents

Hirohiko Okabe holds a patent for a photometric apparatus. This invention aims to improve measurement precision by optimizing the state of light incident to a sensor. His innovative approach has the potential to advance the accuracy of light measurement in various applications.

Career Highlights

Okabe is currently employed at Sekonic Corporation, a company renowned for its expertise in light measurement technology. His role at Sekonic allows him to apply his inventive skills and contribute to the development of advanced photometric devices.

Collaborations

Throughout his career, Hirohiko Okabe has collaborated with talented individuals such as Tomohide Kanzawa and Hiroshi Harada. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Hirohiko Okabe's contributions to photometric technology exemplify the impact of innovation in enhancing measurement precision. His work continues to influence the field and inspire future advancements in light measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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