The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Sep. 02, 2015
Applicant:
Sekonic Corporation, Tokyo, JP;
Inventors:
Tomohide Kanzawa, Tokyo, JP;
Hiroshi Harada, Tokyo, JP;
Yasushi Fukazawa, Tokyo, JP;
Eigo Yoshikawa, Tokyo, JP;
Hirohiko Okabe, Tokyo, JP;
Assignee:
SEKONIC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/02 (2006.01); G01J 1/04 (2006.01); G01J 1/02 (2006.01); G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0272 (2013.01); G01J 1/0233 (2013.01); G01J 1/0403 (2013.01); G01J 1/0411 (2013.01); G01J 1/0418 (2013.01); G01J 1/0422 (2013.01); G01J 1/0448 (2013.01); G01J 1/0474 (2013.01); G01J 3/0202 (2013.01); G01J 3/0205 (2013.01); G01J 3/0208 (2013.01); G01J 3/0213 (2013.01); G01J 3/0216 (2013.01); G01J 3/0237 (2013.01); G01J 3/46 (2013.01);
Abstract
This is to provide a photometric apparatus improved in measurement precision by improving the state of light incident to a sensor,