Company Filing History:
3 out of 3,597 
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Years Active: 2012-2014
Title: Hiroaki Tomita: Innovator in Semiconductor Technology
Introduction
Hiroaki Tomita is a notable inventor based in Ota, Japan, recognized for his contributions to semiconductor technology. With a total of three patents to his name, he has made significant advancements in the field, particularly in the manufacturing processes of semiconductor devices.
Latest Patents
One of his latest patents is for a semiconductor device and method of manufacturing the same. This invention addresses the issue of preventing a second wiring from forming a narrowed portion on the lower surface of a step portion during the manufacturing of a CSP type semiconductor device. The design allows the second wiring to connect to the back surface of a first wiring while extending over the step portion of a window formed from the back surface of the semiconductor die. Another significant patent involves a semiconductor device and its manufacturing method aimed at increasing the number of semiconductor devices obtained from a wafer while simplifying the manufacturing process. This method includes forming pad electrodes on a semiconductor substrate and bonding a supporter to the substrate, followed by creating an opening that overlaps the predetermined region.
Career Highlights
Hiroaki Tomita has worked with prominent companies in the semiconductor industry, including Semiconductor Components Industries, LLC and Sanyo Semiconductor Co., Ltd. His experience in these organizations has contributed to his expertise and innovative capabilities in semiconductor technology.
Collaborations
Throughout his career, Tomita has collaborated with notable colleagues, including Kazuyuki Sutou and Kazuyuki Suto. These partnerships have likely fostered an environment of innovation and shared knowledge in the field.
Conclusion
Hiroaki Tomita's work in semiconductor technology showcases his innovative spirit and dedication to advancing manufacturing processes. His patents reflect a commitment to improving efficiency and functionality in semiconductor devices.