Kodaira, Japan

Hiroaki Okano

This inventor holds 1 USPTO granted patent. Top assignee: Konica Minolta, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroaki Okano. Retrieved from https://idiyas.com/inventor/hiroaki-okano-v8yuhyht

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hiroaki Okano: Inventor in Inkjet Nozzle Inspection.

Introduction

Hiroaki Okano is an inventor based in Kodaira, Japan, and is associated with Konica Minolta, Inc. His patent work addresses the inspection of inkjet nozzles.

Latest Patents

Okano is identified with 1 patent: “Nozzle state inspection apparatus, nozzle state inspection method, and non-transitory recording medium storing computer-readable nozzle state inspection program.” The invention describes an apparatus that forms a drive waveform with first and second drive outputs and sends it to multiple nozzles in an inkjet head. It acquires a reverberation waveform from a nozzle under measurement and uses that waveform to inspect for abnormalities, aiming for accurate inspection with an inexpensive configuration.

Career Highlights

The available information connects Okano’s invention to Konica Minolta, Inc. and its inkjet technology. The patent focuses on a practical method for assessing nozzle condition through waveform analysis.

Collaborations

Okano’s listed company affiliation is Konica Minolta, Inc. The provided information does not identify specific co-inventors or other collaborators.

Conclusion

Hiroaki Okano’s patent presents a waveform-based approach to inkjet nozzle inspection, combining abnormality detection with an emphasis on accuracy and cost-effective equipment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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