The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

May. 31, 2024
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventor:

Hiroaki Okano, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
B41J 2/0451 (2013.01); B41J 2/04581 (2013.01); B41J 2/04588 (2013.01);
Abstract

A nozzle state inspection apparatus has an inexpensive configuration and inspects a state of a nozzle by acquiring a reverberation waveform of the nozzle with high accuracy. The nozzle state inspection apparatus includes a hardware processor, in which the hardware processor is capable of forming a drive waveform including first drive output and second drive output and outputting the drive waveform to a plurality of nozzles included in an inkjet head, and the hardware processor acquires, in accordance with the drive waveform, a reverberation waveform generated in a nozzle to be measured among the plurality of nozzles and inspects the nozzle for abnormality.


Find Patent Forward Citations

Okano, Hiroaki. (2026). Nozzle state inspection apparatus, nozzle state inspection method, and non-transitory recording medium storing computer-readable nozzle state inspection program (U.S. Patent No. 12759287). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12759287

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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