Fremont, CA, United States of America

Hin Lum Lee

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Essai, Inc.. Active years: 2024.

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 1


Company Filing History:


Years Active: 2024

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2 patents (USPTO):Explore Patents

Title: Innovations by Hin Lum Lee

Introduction

Hin Lum Lee is a notable inventor based in Fremont, California. He has made significant contributions to the field of integrated circuit testing, holding two patents that showcase his innovative approach to technology.

Latest Patents

One of his latest patents is titled "Hybrid shielding sockets with impedance tuning for integrated circuit device test tooling." This invention greatly extends the high-frequency operation of an integrated circuit test system by incorporating a dedicated high-frequency signal element. This element provides a circuit-specific compensation network as part of the intermediation circuit board, enabling connectivity between test equipment and the integrated circuit under test.

Another significant patent is the "Probe system for QFP integrated circuit device test tooling." This automated high-speed test solution is designed for Quad Flat Pack device packages. It enables connectivity between test equipment and the integrated circuit under test. The test probe geometry provides highly repeatable and reliable connections suitable for use with consumer-grade QFP devices, coupled with ease of maintenance. In some embodiments, the probe tip ends are chisel-shaped, and the probes can be slightly slanted with respect to a vertical axis of the probe retaining block.

Career Highlights

Hin Lum Lee is currently employed at Essai, Inc., where he continues to develop innovative solutions for integrated circuit testing. His work has significantly impacted the efficiency and reliability of testing processes in the industry.

Collaborations

Throughout his career, Hin Lum Lee has collaborated with talented individuals such as Nasser Barabi and Chee Wah Ho. These collaborations have contributed to the advancement of technology in integrated circuit testing.

Conclusion

Hin Lum Lee's contributions to the field of integrated circuit testing through his patents demonstrate his innovative spirit and dedication to advancing technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
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