Bengaluru, India

Himanshu Pandotra

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Himanshu Pandotra. Retrieved from https://idiyas.com/inventor/himanshu-pandotra

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Himanshu Pandotra: Innovator in Image Reconstruction Technology

Introduction

Himanshu Pandotra is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of image processing, particularly through his innovative patent that addresses the challenges of obtaining reconstructed images in the presence of obstructions.

Latest Patents

Himanshu holds a patent for a "Method and electronic device for obtaining reconstructed image." This method involves capturing images from sensors, generating obstruction-free images, and aligning them to create a clear reconstructed image. His invention is particularly useful in scenarios where obstructions can hinder the clarity of captured scenes.

Career Highlights

Himanshu is currently employed at Samsung Electronics Co., Ltd., where he continues to develop cutting-edge technologies. His work focuses on enhancing image processing techniques, which are crucial for various applications in consumer electronics.

Collaborations

Himanshu has collaborated with esteemed colleagues such as Paritosh Mittal and Aloknath De. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Himanshu Pandotra's contributions to image reconstruction technology exemplify the impact of innovative thinking in solving complex problems. His work not only enhances the capabilities of electronic devices but also paves the way for future advancements in image processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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