The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jul. 13, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Shankar M Venkatesan, Bengaluru, IN;
Himanshu Pandotra, Bengaluru, IN;
Paritosh Mittal, Bengaluru, IN;
Viswanath Veera, Bengaluru, IN;
Aloknath De, Bengaluru, IN;
Rohith C Aralikkatti, Bengaluru, IN;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method for obtaining a reconstructed image is provided. The method includes capturing, by the electronic device, a first sensor image and a second sensor image including a scene and an obstruction in the scene. The method includes generating, by the electronic device, an obstruction-free first image, a first obstruction template, an obstruction-free second image and a second obstruction template. Further, determining, a parallax shift between the obstruction-free first image and the obstruction-free second image and aligning the obstruction-free second image with respect to the obstruction-free first image and the second sensor image with respect to the first sensor image using the determined parallax shift. Further, the method includes determining occluded portions in the first sensor image and in the obstruction-free first image at corresponding locations in the aligned second sensor image and aligned obstruction-free second image respectively and obtaining the reconstructed obstruction-free first image.