Bengaluru, India

Himadri Shekhar Handsa

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Himadri Shekhar Handsa. Retrieved from https://idiyas.com/inventor/himadri-shekhar-handsa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Himadri Shekhar Handsa: Innovator in Substrate Measurement Technology

Introduction

Himadri Shekhar Handsa is a notable inventor based in Bengaluru, India. She has made significant contributions to the field of substrate measurement technology. With a focus on precision and accuracy, her work has implications for various industries.

Latest Patents

Himadri holds a patent for a method titled "Measurement of Inherent Substrate Distortion." This innovative method includes obtaining first data indicative of a measured profile of a substrate. It further involves obtaining second data indicative of a profile of a reference substrate. The process culminates in determining a corrected substrate profile based on the first and second data. Additionally, it includes performing a corrective action based on the corrected substrate profile. This patent showcases her expertise and commitment to advancing technology.

Career Highlights

Himadri is currently employed at Applied Materials, Inc., a leading company in the field of materials engineering. Her role involves applying her innovative ideas to enhance the company's technological offerings. She has demonstrated a strong ability to solve complex problems through her inventive work.

Collaborations

Some of her coworkers include Piyush Kumar Pandey and Prabal Sen. Their collaboration fosters a creative environment that encourages innovation and the development of new technologies.

Conclusion

Himadri Shekhar Handsa is a remarkable inventor whose work in substrate measurement technology is paving the way for advancements in various fields. Her contributions are a testament to her dedication and expertise in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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