Peabody, MA, United States of America

Hiep Tran

This inventor holds 2 USPTO granted patents. Top assignee: L-3 Communications Security and Detection Systems Corporation. Active years: 2017-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiep Tran. Retrieved from https://idiyas.com/inventor/hiep-tran-jypergr3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2017-2018

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2 patents (USPTO):Explore Patents

Title: Hiep Tran: Innovator in X-ray Screening Technology

Introduction

Hiep Tran is a notable inventor based in Peabody, MA (US). He has made significant contributions to the field of security and detection systems, particularly in the development of X-ray screening technology. With a total of 2 patents to his name, Tran has established himself as a key figure in his industry.

Latest Patents

Hiep Tran's latest patents include an innovative X-ray screener. This technology is designed to enhance the efficiency and accuracy of security screenings, making it a vital tool in various applications.

Career Highlights

Tran is currently employed at L-3 Communications Security and Detection Systems Corporation, where he continues to work on advancing security technologies. His role at the company allows him to apply his expertise in developing cutting-edge solutions for security challenges.

Collaborations

Throughout his career, Hiep Tran has collaborated with talented individuals such as Thomas Warnick and Sandra Hiltz. These partnerships have contributed to the successful development of his patented technologies.

Conclusion

Hiep Tran's work in the field of X-ray screening technology showcases his innovative spirit and dedication to enhancing security measures. His contributions are invaluable to the industry and continue to influence advancements in detection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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