The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Sep. 15, 2015
Applicant:

L-3 Communications Security and Detection Systems, Inc., Woburn, MA (US);

Inventors:

Hiep Tran, Peabody, MA (US);

Thomas Warnick, Lowell, MA (US);

Sandra Hiltz, Salem, MA (US);

Michael Lanzaro, North Reading, MA (US);

Gregory J. Tobin, Southborough, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
U.S. Cl.
CPC ...

Find Patent Forward Citations

Tran, Hiep. (2017). X-ray screener (U.S. Patent No. D794797). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/D794797

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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