This inventor holds 2 USPTO granted patents. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2011-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011-2013
Title: The Innovations of Hideyuki Okamoto
Introduction
Hideyuki Okamoto is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of foreign matter inspection technology. With a total of 2 patents, Okamoto's work has advanced the capabilities of inspection apparatuses in various applications.
Latest Patents
Okamoto's latest patents focus on a foreign matter inspection apparatus that utilizes alignment marks for optimal template selection. The apparatus conducts identification and similarity judgment through a calculation function of a correlation value. This innovative device includes a unit for registering feature points of alignment marks on the surface of an inspected object. Additionally, it features a unit for collecting image data of these alignment marks and a data processor that extracts feature points from the image data. The processor calculates a correlation value between the feature points and registers the image data based on a threshold value of this correlation.
Career Highlights
Hideyuki Okamoto is associated with Hitachi High-Technologies Corporation, where he has contributed to the development of advanced inspection technologies. His work has been instrumental in enhancing the accuracy and efficiency of foreign matter detection in various industries.
Collaborations
Okamoto has collaborated with notable colleagues such as Eiji Imai and Masami Ooyama. Their combined expertise has further propelled advancements in the field of inspection technology.
Conclusion
Hideyuki Okamoto's innovative contributions to foreign matter inspection technology demonstrate his commitment to enhancing industrial processes. His patents reflect a deep understanding of the technical challenges in this field and provide solutions that are both practical and effective.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
