Tokyo, Japan

Hidetaka Kanazawa

This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignee: Chiyoda Technol Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidetaka Kanazawa. Retrieved from https://idiyas.com/inventor/hidetaka-kanazawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Hidetaka Kanazawa: Innovator in Nondestructive Inspection Technology

Introduction

Hidetaka Kanazawa is a prominent inventor based in Tokyo, Japan. He is known for his innovative contributions to the field of nondestructive inspection technology. His work has significantly advanced the methods used in this critical area of research and industry.

Latest Patents

Kanazawa holds a patent for a "Radiation source for nondestructive inspection, and method and apparatus for manufacturing same." This invention involves the creation of a spherical irradiation target made from iridium metal, which can be either natural or enriched. The design allows for improved nondestructive inspection images with high geometric resolution, eliminating radiation source anisotropy and enhancing target recyclability.

Career Highlights

Kanazawa is associated with Chiyoda Technol Corporation, where he has made significant strides in developing advanced technologies. His expertise in radiation sources has positioned him as a key figure in the field of nondestructive testing.

Collaborations

Throughout his career, Kanazawa has collaborated with notable colleagues, including Hiroshi Kawamura and Takashi Saito. These partnerships have fostered innovation and contributed to the success of various projects.

Conclusion

Hidetaka Kanazawa's work in nondestructive inspection technology exemplifies the impact of innovative thinking in engineering. His contributions continue to influence the industry and enhance inspection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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