EPO Patents = 2

Forward Citations = 13

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12 inventors (with patents filed for the assignee):

Takashi Saito (1 out of 77 patents)

Takashi Uchida (1 out of 18 patents)

Takashi Ishii (1 out of 33 patents)

4. Hiroshi Kawamura (1 out of 27 patents)

5. Takashi Moritake (1 out of 2 patents)

6. Saburo Fujisaki (1 out of 1 patent)

7. Yasuhiro Koguchi (1 out of 1 patent)

8. Hiroshi Mizushima (1 out of 1 patent)

9. Kiyoshi Matsuno (1 out of 1 patent)

10. Hidetaka Kanazawa (1 out of 1 patent)

11. Yasuki Nagai (1 out of 1 patent)

12. Masako Kawabata (1 out of 1 patent)

3 patents: Sort by Forward Citations

1. 12400771 - Scattering fast neutrons that have passed through an irradiated first sample to generate radioisotopes in both the first sample and a second sample (2025-08-26),

2. 11508491 - Radiation source for nondestructive inspection, and method and apparatus for manufacturing same (2022-11-22),

3. 7541599 - Dosimeter fitting wear and body surface exposure dose distribution measuring method and apparatus using the same (2009-06-02),

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

3 Patents

#3,548 in Tokyo

#8,932 in Japan

Tokyo, Japan

Chiyoda Technol Corporation

Forward Citations = 13

12 inventors:

Takashi Saito (1 out of 77 patents)

Takashi Uchida (1 out of 18 patents)

Takashi Ishii (1 out of 33 patents)

4. Hiroshi Kawamura (1 out of 27 patents)

5. Takashi Moritake (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Chiyoda Technol Corporation. Retrieved from https://idiyas.com/company/chiyoda-technol

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]