Aichi, Japan

Hideroh Takahashi

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toyota Chuo Kenkyusho. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideroh Takahashi. Retrieved from https://idiyas.com/inventor/hideroh-takahashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Hideroh Takahashi: Innovator in Stress Detection Technology

Introduction

Hideroh Takahashi is a notable inventor based in Aichi, Japan. He has made significant contributions to the field of stress detection technology. His innovative methods have the potential to enhance the quality and reliability of resin-molded products.

Latest Patents

Takahashi holds a patent for a method for detecting stresses. This method involves dispersing a fluorescent substance in a solid portion where stresses are to be detected. It includes measuring the fluorescence decay time of the fluorescent substance and detecting stresses based on this measurement. This technique allows for non-destructive detection of stresses in resin-molded products without impairing their mechanical properties. He has 1 patent to his name.

Career Highlights

Hideroh Takahashi is associated with Toyota Chuo Kenkyusho, a research and development company under the Toyota Group. His work focuses on advancing technologies that improve product integrity and performance.

Collaborations

Takahashi has collaborated with notable colleagues such as Akane Okada and Toshio Kurauchi. Their combined expertise contributes to the innovative environment at Toyota Chuo Kenkyusho.

Conclusion

Hideroh Takahashi's contributions to stress detection technology exemplify the importance of innovation in enhancing product quality. His work continues to influence the field and showcases the potential of non-destructive testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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