The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1996
Filed:
Mar. 17, 1995
Applicant:
Inventors:
Tohru Shiga, Okazaki, JP;
Akane Okada, Obu, JP;
Hideroh Takahashi, Aichi, JP;
Toshio Kurauchi, Nagoya, JP;
Assignee:
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73762 ; 73862624 ;
Abstract
A method for detecting stresses includes the steps of dispersing a fluorescent substance in a solid portion where stresses are to be detected, measuring fluorescence decay time of the fluorescent substance dispersed in the solid portion, and detecting stresses in the solid portion based on the measured fluorescence decay time. The method enables to non-destructively detect stresses in resin-molded products without impairing their mechanical properties.