Nara, Japan

Hideo Wada


Average Co-Inventor Count = 2.1

ph-index = 4

Forward Citations = 97(Granted Patents)


Location History:

  • Tenri, JP (2005)
  • Kitakatsuragi-gun, JP (2007)
  • Katsuragi, JP (2006 - 2010)
  • Nara, JP (2007 - 2011)
  • Osaka, JP (2012 - 2017)

Company Filing History:


Years Active: 2005-2017

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17 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Hideo Wada

Introduction

Hideo Wada is a prominent inventor based in Nara, Japan, known for his significant contributions to optical distance measuring technology. With a total of 17 patents to his name, Wada has made remarkable advancements in the field of electronic apparatuses.

Latest Patents

Wada's latest patents include an optical distance measuring apparatus and an electronic apparatus that incorporates this technology. The optical distance measuring apparatus is designed to accurately measure distances regardless of temperature variations, while also being cost-effective to manufacture. The apparatus features a lead frame with multiple first reinforcing terminals, which are fixed by a light-blocking resin body and connected to a light-receiving header. Another notable patent is an optical distance-measuring device that utilizes a metal lens frame to minimize thermal expansion issues, ensuring consistent performance even with temperature changes.

Career Highlights

Throughout his career, Wada has worked with notable companies such as Sharp Corporation and Pixart Imaging Incorporated. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge technologies in optical measurement.

Collaborations

Wada has collaborated with talented individuals in the field, including Takayuki Taminaga and Nobuhisa Watanabe. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Hideo Wada's work in optical distance measuring technology showcases his dedication to innovation and excellence. His patents reflect a commitment to improving electronic devices and enhancing measurement accuracy.

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