Honjyo, Japan

Hidekuni Sugimoto


Average Co-Inventor Count = 18.0

ph-index = 2

Forward Citations = 57(Granted Patents)


Company Filing History:

goldMedal2 out of 832,843 
Other
 patents

Years Active: 2003-2004

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2 patents (USPTO):Explore Patents

Title: Innovations of Hidekuni Sugimoto

Introduction

Hidekuni Sugimoto is a notable inventor based in Honjyo, Japan. He has made significant contributions to the field of process management systems, particularly in the inspection of defects on wafers. With a total of 2 patents to his name, Sugimoto's work has advanced the understanding and management of defects in manufacturing processes.

Latest Patents

Sugimoto's latest patents include a "Process Management System" and a "Process Control System." Both inventions focus on the inspection of defects on wafers using inspection apparatuses connected through a communication network. The systems collect inspection information and image information to construct a database and an image file. By defining defects through combinations of elements that characterize them, these systems allow for a detailed study of defect characteristics and their causes.

Career Highlights

Throughout his career, Sugimoto has demonstrated a commitment to innovation in process management. His inventions have been instrumental in improving the efficiency and accuracy of defect inspections in the semiconductor industry. His work has not only contributed to technological advancements but has also paved the way for further research in this critical area.

Collaborations

Sugimoto has collaborated with notable coworkers such as Fumio Mizuno and Seiji Isogai. Their combined expertise has fostered a productive environment for innovation and development in their respective fields.

Conclusion

Hidekuni Sugimoto's contributions to process management systems highlight his role as a key inventor in the industry. His patents reflect a deep understanding of defect management, which is essential for advancing manufacturing technologies.

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