Company Filing History:
Years Active: 2011-2012
Title: Innovations of Hideki Soeda in Optical Inspection Technology.
Introduction
Hideki Soeda is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of optical inspection technology, particularly in semiconductor manufacturing. With a total of 2 patents, Soeda's work focuses on improving the efficiency and accuracy of defect detection in semiconductor wafers.
Latest Patents
Soeda's latest patents include an optical inspection method and an optical inspection system. These innovations provide a solution for classifying and inspecting defects such as scratches, voids, and particles produced during the flattening process in semiconductor manufacturing. The optical semiconductor wafer inspection system is characterized by obliquely illuminating defects on the surface of a polished or ground insulating film. This method detects scattered light at different angles, allowing for effective classification of the defects.
Career Highlights
Soeda is associated with Hitachi High-Technologies Corporation, where he has been instrumental in advancing optical inspection technologies. His work has contributed to enhancing the quality control processes in semiconductor manufacturing, ensuring higher standards in product reliability.
Collaborations
Soeda collaborates with Masayuki Ochi, a fellow innovator in the field. Their combined expertise has led to advancements in optical inspection methodologies, further pushing the boundaries of semiconductor technology.
Conclusion
Hideki Soeda's contributions to optical inspection technology have made a significant impact on the semiconductor industry. His innovative patents and collaborative efforts continue to drive advancements in this critical field.