Saitama, Japan

Hideki Otsuka

This inventor holds 1 USPTO granted patent. Top assignee: A&d Company, Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideki Otsuka. Retrieved from https://idiyas.com/inventor/hideki-otsuka-b6eis2or

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hideki Otsuka

Introduction

Hideki Otsuka is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of weighing technology. His innovative approach has led to the development of a unique weighing apparatus that enhances the detection of abnormalities during weighing processes.

Latest Patents

Otsuka holds a patent for a "Weighing apparatus having an abnormality detection means." This invention provides a weighing apparatus that enables the detection of abnormalities effectively. The apparatus includes a rectangular weighing base, weighing sensors positioned at the four corners, and a control unit that calculates the weight of an object based on sensor outputs. The abnormality detection means compares current sensor outputs with past values to identify any discrepancies.

Career Highlights

Hideki Otsuka is associated with A&D Company, Limited, where he has been instrumental in advancing weighing technologies. His work has focused on improving the reliability and accuracy of weighing systems, making them more efficient for various applications.

Collaborations

Otsuka collaborates with Tsutomu Kowa, contributing to the development of innovative solutions in weighing technology. Their partnership has fostered advancements that benefit the industry.

Conclusion

Hideki Otsuka's contributions to weighing technology through his innovative patent demonstrate his commitment to enhancing the accuracy and reliability of weighing systems. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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